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专利名称：SAMPLE ANALYSIS APPARATUS AND A
METHOD OF ANALYSING A SAMPLE
发明人：McKAY, Benjamin,BENTSCHAP KNOOK, Dirk,
François,VAN BANNING, Srephan,Olivier,COETZEE, Anita
申请号：EP09747933.1申请日：20091102公开号：EP23529A1公开日：20110810
摘要：The invention relates to a sample analysis apparatus. The apparatus comprises:a radiation system to irradiate the sample in a vial and an analyser with a camera toanalyse the radiation received from the sample in the vial. The apparatus is provided witha holder to releasable hold the vial and with an optical path for the radiation system toirradiate the sample and for the camera to make images of the sample. The radiationsystem can be used for front lighting of the sample in the vial or for back lighting of thesample in the vial. The camera may be provided with a telecentric lens.
申请人：Avantium Holding B.v.
地址：Zekeringstraat 29 1014 BV Amsterdam NL
国籍：NL
代理机构：Fluit, Jeroen
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